To summarize our results, we found that sinusoidal patterns are sensitive to sharpening, though often less so than low contrast (4:1) slanted-edges. The Siemens Star is of particular interest because, along with the slanted-edge, it is included in the ISO 12233:2014 standard. In this page we address concerns about the sensitivity of slanted-edge patterns to signal processing, especially sharpening, and we correct the misconception that sinusoidal patterns, such as the Siemens star, are insensitive to sharpening, and hence provide more robust and stable MTF measurements. ![]() A comparison of sensitivity to signal processing
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